CALL FOR PAPERS SPECIAL ISSUE ON
Applied Statistics and Reliability Analysis
Quality Technology & Quantitative Management
Guest Co-Editors
Dear Colleagues,
The authors whose paper will be published in the proceedings of APARM 2010 (4th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling) are invited to submit an extended version to Quality Technology & Quantitative Management (QTQM). A special issue of Quality Technology and Quantitative Management (QTQM) will be devoted to Applied Statistics and Reliability Analysis. Limitless global competition and higher customer expectations for products have driven more emphasis on sophisticated statistical methodology and reliability. Now, reliability is being viewed as a key product feature to provide an important competitive edge. The purpose of this special issue is to share, with researchers and practitioners, the ideas on most recent topics for the following:
- Estimation and Statistical Tests
- Accelerated Life Testing
- Software Reliability and Testing
- Statistical Process Control, Design of Experiments
- System & Network Reliability and Optimization
- Maintenance Modeling and Optimization
Authors should prepare their manuscripts in Microsoft word or TeX/LaTeX and send the electronic file (in PDF format) to one of the Guest Editors. Generally the size of a manuscript should not exceed 15 printed pages. Submitted papers should not have been previously published nor be currently under consideration for publication elsewhere. Refereeing and the selection of papers will be carried out according to the standard of QTQM journal. For more information regarding the preparation of the manuscript, please visit the journal website at
http://www.cc.nctu.edu.tw/~qtqm/
Important Dates:
- 15 February 2011: Paper Submission Deadline
- 15 May 2011: Acceptance/Rejection Notification
- 15 June 2011: Final Manuscript due
Events/APARM2010
(19 Apr 2011) Special Issues
